Department Materials Secondary Department Materials Research Laboratory Facility Name Microscopy and Microanalysis Facility Off-Campus User Access Available Primary Contact Krishna Prasad Koirala Link FEI Helios Dual-beam 600 FIB/SEM Category/Type Imaging & Microscopy Search Tags focused ion beam FIB dual-beam FIB-SEM scanning electron microscopy SEM TEM lamella preparation cross-sectioning site-specific milling serial sectioning EDS nanofabrication