The MRL X-Ray Facility provides state-of-the-art X-ray diffraction and scattering tools for characterizing the structural properties of a wide range of materials, from metals and composites to polymers, biological materials, and electronic and optoelectronic materials, across length scales from 0.1 to 100 nm. Capabilities include powder diffraction and texture analysis, high-resolution thin-film diffraction and reflectometry, small- and wide-angle X-ray scattering (SAXS/WAXS), and X-ray fluorescence, supported by both commercial and custom-built instruments.
Facility URL
Location
Materials Research Laboratory